TITLE

Automatic fast fitting of single Langmuir probe characteristics on RFX

AUTHOR(S)
Bagatin, M.; Desideri, D.; Martines, E.; Manduchi, G.; Serianni, G.; Antoni, V.
PUB. DATE
January 1997
SOURCE
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p365
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes three different methods for automatic analysis of the large number of current-voltage characteristics of single Langmuir probes used in the RFX reversed field pinch for time-resolved measurements of edge electron density and temperature. Fitting procedure; Neural network method; Minimum temperature approach; Cost function approach.
ACCESSION #
630720

 

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