Automatic fast fitting of single Langmuir probe characteristics on RFX

Bagatin, M.; Desideri, D.; Martines, E.; Manduchi, G.; Serianni, G.; Antoni, V.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p365
Academic Journal
Describes three different methods for automatic analysis of the large number of current-voltage characteristics of single Langmuir probes used in the RFX reversed field pinch for time-resolved measurements of edge electron density and temperature. Fitting procedure; Neural network method; Minimum temperature approach; Cost function approach.


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