A spatial detector array for measuring plasma turbulence with the heavy ion beam probe

Beckstead, J. A.; Aceto, S.C.; Crowley, T. P.; Demers, D.; McLaren, P. E.; Ouroua, A.; Schatz, J. G.; Schoch, P.M.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p328
Academic Journal
Describes a detector design developed by InterScience Inc. that utilizes electrostatic suppression of the secondary electrons produced either by photons and neutrals radiated from the plasma or by the secondary ions to measure plasma turbulence in the heavy ion beam probe. Motivation for the detector array; Density fluctuation measurements; Spacing of the detector elements.


Related Articles

  • Mechanism of secondary ion emission from an Al sample under MeV heavy ion bombardment. Xue, J.; Ninomiya, S.; Gomi, S.; Imanishi, N. // AIP Conference Proceedings;2001, Vol. 576 Issue 1, p145 

    Sputtering yields and kinetic energy distributions (KED) of Al atomic ions ejected from a pure aluminum sample under MeV silicon ion bombardment were simulated with the molecular dynamics (MD) method. Since the electronic energy loss (S[sub e]) is much higher than the nuclear energy loss (S[sub...

  • Ion sources for heavy ion fusion (invited). Yu, Simon S.; Eylon, S.; Chupp, W.; Henestroza, E.; Lidia, S.; Peters, C.; Reginato, L.; Tauschwitz, A.; Grote, D.; Deadrick, F. // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1098 

    Reports on the development ion sources for heavy ion fusion. Fabrication of large thermonic ion emitters; Beam extraction using a 2 MeV injector; Design of the beam optics; Range of voltages and currents produced by the injector; Energy flatness of the ion beam.

  • Secondary ions produced by 400 eV He[sup +] ion impact on N[sub 2] and O[sub 2] thin films at 8 K. Hiraoka, K.; Sato, T.; Watanabe, M.; Mori, K.; Kimura, M. // Journal of Chemical Physics;10/1/2002, Vol. 117 Issue 13, p6252 

    Secondary ions produced by 400 eV He[sup +] ion impact on N[sub 2] and O[sub 2] thin films deposited on a silicon substrate at 8 K were measured as a function of film thickness using a time-of-flight secondary-ion mass spectrometer. While the N[sup +, sub n] ions with n up to 4 were observed for...

  • Secondary electron emission from boron-doped diamond under ion impact: Application in single-ion.... Kamiya, Tomihiro; Cholewa, Marian // Applied Physics Letters;9/29/1997, Vol. 71 Issue 13, p1875 

    Examines secondary electron emission from boron-doped diamond under ion impact. Stability of the yield under ion impact; Detection of the passage of each ion through the field; Application of results in single-ion irradiation systems.

  • Low-energy ion beam extraction and transport: Experiment–computer comparison. Spädtke, Peter; Brown, Ian; Fojas, Paul // Review of Scientific Instruments;Apr94, Vol. 65 Issue 4, p1441 

    Ion beam formation at low energy (∼1 kev or so) is more difficult to accomplish than at high energy because of beam blowup by space-charge forces in the uncompensated region within the extractor, an effect which is yet more pronounced for heavy ions and for high beam current density. For...

  • Development of heavy ion probe diagnostics (abstract). Melnikov, A.V. // Review of Scientific Instruments;Jan1995, Vol. 66 Issue 1, p320 

    Presents the results of the activity of Kharkov and Moscow joint heavy ion beam probe (HIBP) diagnostics project. Mathematical aspects of the diagnostics; Properties of the optimization problems.

  • Influence of hydrodynamic expansion on specific power deposition by a heavy ion beam in matter. Tahir, N. A.; Kozyreva, A.; Spiller, P.; Hoffman, D. H. H.; Shutov, A. // Physics of Plasmas;Feb2001, Vol. 8 Issue 2, p611 

    In this paper, we show with the help of two-dimensional numerical simulations that the specific power deposition by a heavy ion beam in matter may significantly decrease due to hydrodynamic expansion of the target during irradiation. It has also been shown that in order to maximize the specific...

  • Electron temperature measurements with heavy ion beam probes. Schoch, P. M.; Goyer, J. R.; Solensten, L.; Michael, J. D.; Saravia, E.; Connor, K. A.; Jennings, W. C.; Hickok, R. L.; Bieniosek, F. M.; Bresnock, F. J. // Review of Scientific Instruments;May85, Vol. 56 Issue 5, p1044 

    The total abundance of secondary ion current detected from a heavy ion beam probe (proportional to n[sub σ[sub efl]]) is a function of the electron temperature through the collision cross section, n and T[sub e] can be separated by probing the same volume with two different ion species or...

  • Generation of fluxes of highly charged heavy ions from a picosecond laser-produced plasma. Badziak, J.; Parys, P.; Vankov, A. B.; Wolowski, J.; Woryna, E. // Applied Physics Letters;7/2/2001, Vol. 79 Issue 1, p21 

    The results of the investigations of ion emission from targets of medium and high atomic numbers irradiated by 1 ps laser pulse of intensity up to 5x10[sup 16] W/cm[sup 2] are presented. The generation of high energy (up to 1 MeV) highly charged heavy ions (Ta[sup +38], Au[sup +33]), as well as...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics