TITLE

Scanned-probe lateral-force determination of fluid-dynamic effects near a solid surface in air

AUTHOR(S)
Drummond Roby, M. A.; Wetsel, G. C.; Wang, C.-Y.
PUB. DATE
July 1996
SOURCE
Applied Physics Letters;7/1/1996, Vol. 69 Issue 1, p130
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A calibrated method for the experimental determination of dynamic lateral force using a scanned probe in air has been applied to the measurement of force vs distance as the probe tip approaches a solid surface. The probe is a fused silica fiber vibrated with its axis perpendicular to the surface in a configuration commonly used for distance regulation in near-field scanned optical microscopes. Quantitative agreement of a fluid-dynamic model with the approach data demonstrates that the effects of fluids between the probe and the surface dominate the force on the probe in the optical far field. A two-layer fluid model indicates that fluid-dynamic effects must also be considered in lateral-force determination in the optical near field. © 1996 American Institute of Physics.
ACCESSION #
6289161

 

Related Articles

  • Dynamic scanned-probe lateral-force determination. Wetsel Jr., G.C.; Roby, M.A. Drummond // Applied Physics Letters;10/30/1995, Vol. 67 Issue 18, p2735 

    Describes a continuum-mechanical model of the dynamics of a scanned probe. Effect of a lateral force on the end of the probe; Determination of calibrated lateral force; Vibration of the fiber parallel to the surface for distance regulation.

  • Development of a microlateral force sensor and its evaluation using lateral force microscopy. Ando, Yasuhisa; Shiraishi, Naoki // Review of Scientific Instruments;Mar2007, Vol. 78 Issue 3, p033701 

    A microlateral force sensor (MLFS) was developed and evaluated using atomic force microscopy (AFM). The sensor was attached to a sensing table supported by a suspension system. The lateral motion of the sensing table was activated by a comb actuator. The driving voltage to the comb actuator was...

  • Direct Measurement of Lateral Force Using Dual Cantilevers. Makoto Ishikawa; Masaya Ichikawa; Kouji Miura // Sensors (14248220);2012, Vol. 12 Issue 3, p3200 

    We have constructed an experimental system to measure a piconewton lateral force using dual cantilevers which cross with each other. The resolution of the lateral force is estimated to be 3.3 p ± 0.2 pN, which is comparable to forces due to thermal fluctuation. This experimental apparatus...

  • Quantitative nanofriction characterization of corrugated surfaces by atomic force microscopy. Podestà, A.; Fantoni, G.; Milani, P. // Review of Scientific Instruments;May2004, Vol. 75 Issue 5, p1228 

    Atomic force microscopy (AFM) is a suitable tool to perform tribological characterization of materials down to the nanometer scale. An important aspect in nanofriction measurements of corrugated samples is the local tilt of the surface, which affects the lateral force maps acquired with AFM....

  • A versatile stable scanning proximal probe microscope. Jahncke, C.L.; Hallen, H.D. // Review of Scientific Instruments;Apr97, Vol. 68 Issue 4, p1759 

    Presents a novel scanning proximal probe microscope design utilizing a piezoelectric driven coarse positioning mechanism in x, y and z while maintaining relatively small lateral dimensions. Design and principle of operation of the instrument; Coarse positioning; Mechanism used for generating...

  • High resolution scanning photoluminescence characterization of semi-insulating GaAs using a laser scanning microscope. Marek, J.; Elliot, A. G.; Wilke, V.; Geiss, R. // Applied Physics Letters;12/22/1986, Vol. 49 Issue 25, p1732 

    Spatially resolved photoluminescence properties of semi-insulating, liquid encapsulated Czochralski-grown GaAs substrates are analyzed with a laser scanning microscope. The improved resolution of the laser scanning microscope results in the observation of single dislocations within the subgrain...

  • Scanning probe microscope users demand everything they...  // R&D Magazine;Mar96, Vol. 38 Issue 4, p42 

    Reports that scanning probe microscope (SMP) users, demands reproducibility, accuracy and resolution. Use of SMP; Most common mode for operating SPMs; Performance of SPM.

  • New products.  // R&D Magazine;Mar96, Vol. 38 Issue 4, p43 

    Reports that K-Tek's model P4-SPM-MDT scanning probe microscope, offers a variety of investigative tools, plus vibration protection at 40 dB. Omicron Associates' two scanning tunneling microscopes, the VT STM and LT STM.

  • Product roundup.  // R&D Magazine;Mar96, Vol. 38 Issue 4, p44 

    Presents information on various scanning microscopes. Burleigh Instruments' Personal SPM microscope; Kurt J. Lesker Company's STM1000 scanning tunneling microscope system; Molecular Imaging's PicoSPM scanning probe microscopes; Products feature.

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics