An improved electron transmission method for measuring electron trapping cross sections at the surface of dielectric films

Nagesha, K.; Gamache, J.; Bass, A.D.; Sanche, L.
October 1997
Review of Scientific Instruments;Oct97, Vol. 68 Issue 10, p3883
Academic Journal
Investigates several problems inherent in the low energy electron transmission technique for measuring cross sections for charge trapping, by submonolayer quantities of a target molecule deposited onto the surface of a dielectric film. Energy of the incident electron beam while charging the film; Interactions between trapped charges and the metallic substrate.


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