TITLE

An improved electron transmission method for measuring electron trapping cross sections at the surface of dielectric films

AUTHOR(S)
Nagesha, K.; Gamache, J.; Bass, A.D.; Sanche, L.
PUB. DATE
October 1997
SOURCE
Review of Scientific Instruments;Oct97, Vol. 68 Issue 10, p3883
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates several problems inherent in the low energy electron transmission technique for measuring cross sections for charge trapping, by submonolayer quantities of a target molecule deposited onto the surface of a dielectric film. Energy of the incident electron beam while charging the film; Interactions between trapped charges and the metallic substrate.
ACCESSION #
627531

 

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