Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector

Kleymenov, Evgeny; van Bokhoven, Jeroen A.; David, Christian; Glatzel, Pieter; Janousch, Markus; Alonso-Mori, Roberto; Studer, Marco; Willimann, Markus; Bergamaschi, Anna; Henrich, Beat; Nachtegaal, Maarten
June 2011
Review of Scientific Instruments;Jun2011, Vol. 82 Issue 6, p065107
Academic Journal
A Johann-type spectrometer with five spherically bent crystals and a pixel detector was constructed for a range of hard x-ray photon-in photon-out synchrotron techniques, covering a Bragg-angle range of 60°-88°. The spectrometer provides a sub emission line width energy resolution from sub-eV to a few eV and precise energy calibration, better than 1.5 eV for the full range of Bragg angles. The use of a pixel detector allows fast and easy optimization of the signal-to-background ratio. A concentration detection limit below 0.4 wt% was reached at the Cu Kα1 line. The spectrometer is designed as a modular mobile device for easy integration in a multi-purpose hard x-ray synchrotron beamline, such as the SuperXAS beamline at the Swiss Light Source.


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