TITLE

A piezo-thermal probe for thermomechanical analysis

AUTHOR(S)
Gaitas, Angelo; Gianchandani, Sachi; Zhu, Weibin
PUB. DATE
May 2011
SOURCE
Review of Scientific Instruments;May2011, Vol. 82 Issue 5, p053701
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Thermomechanical analysis (TMA) is widely used to characterize materials and determine transition temperatures and thermal expansion coefficients. Atomic-force microscopy (AFM) microcantilevers have been used for TMA. We have developed a micromachined probe that includes two embedded sensors: one for measuring the mechanical movement of the probe (deflection) and another for providing localized heating. The new probe reduces costs and complexity and allow for portability thereby eliminating the need for an AFM. The sensitivity of the deflection element ((ΔR/R)/deflection) is 0.1 ppm/nm and its gauge factor is 3.24. The melting temperature of naphthalene is measured near 78.5 °C.
ACCESSION #
62010792

 

Related Articles

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics