TITLE

Taking the mixed-signal voltage reference to a higher level

AUTHOR(S)
Baker, Bonnie
PUB. DATE
November 2010
SOURCE
EDN Europe;Nov2010, Vol. 57 Issue 11, p24
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
The article presents suggestions for selecting voltage references in a mixed-signal application with the help of several circuit diagrams. It mentions that the first diagram focuses oscilloscope's low-capacitive probe which captures the voltage drop between the input of the analog-to-digital converter's (ADC) voltage-reference pin and voltage reference output. It further investigates the voltage references in three-terminal series configurations and digital-to-analog converter (DAC).
ACCESSION #
61228660

 

Related Articles

  • An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration. Huang, Xuan-Lun; Huang, Jiun-Lang; Chen, Hung-I; Chen, Chang-Yu; Kuo-Tsai, Tseng; Huang, Ming-Feng; Chou, Yung-Fa; Kwai, Ding-Ming // Journal of Electronic Testing;Oct2012, Vol. 28 Issue 5, p705 

    This paper presents a self-testing and calibration technique for the embedded successive approximation register (SAR) analog-to-digital converter (ADC) in system-on-chip (SoC) designs. We first proposed a low cost design-for-test (DfT) technique that estimates the SAR ADC performance before and...

  • Reference Circuits Address Practical Circuit Design Challenges. Croke, Claire; Riordan, Liam; O'Grady, Albert // ECN: Electronic Component News;Dec2011, Vol. 55 Issue 14, p14 

    The article focuses on the solutions in overcoming the challenges encountered by circuit designers in the development of electronic products in the U.S. The Circuits from the Lab reference circuits from Analog Devices Inc. are highlighted which offer circuit solutions to circuit designers....

  • Considering Broadband Circuits With ADCs And DACs.  // Microwaves & RF;Oct2004, Vol. 43 Issue 10, p86 

    Focuses on an application note released by Atmel Corp. which details the combination of analog-to-digital converters with digital-to-analog converters to achieve optimum performance for broadband circuits. Difference between ball-grid-array and quad-flatpack housings; Parameters in selecting a...

  • How voltage references affect mixed-signal parts. Baker, Bonnie // EDN Europe;Oct2010, Vol. 57 Issue 10, p12 

    The article offers information on the role of voltage references in the performance of analog to digital converters (ADCs) and digital to analog converters (DACs). It is mentioned that to look for faults in voltage references, their transfer function should be inspected. Also, to evaluate any...

  • 12 b 50 MS/s 0.18 μm CMOS SAR ADC based on highly linear C-R hybrid DAC. Park, J.-S.; Kim, D.-H.; An, T.-J.; Kim, M.-K.; Ahn, G.-C.; Lee, S.-H. // Electronics Letters;2/6/2020, Vol. 56 Issue 3, p119 

    12 b 50 MS/s successive-approximation register (SAR) ADC with a highly linear C-R hybrid DAC is presented. The proposed DAC significantly reduces the required total number of unit capacitors by processing the upper bits based on a binary-weighted capacitor array and the remaining lower bits...

  • DC-accurate, 32-bit DAC achieves 32-bit resolution. Woodward, W. Stephen // EDN;10/30/2008, Vol. 53 Issue 22, p61 

    The article explains how a direct current (DC)-accurate and 32-bit digital-to-analog converter (DAC) achieve 32-bit resolution. It states that applications such as analog-to-digital converter (ADC) testing and calibration need DAC with good resolution, monotonicity, accuracy, and resolution. The...

  • DACs, ADCs increase speed and resolution, cut power. Schweber, Bill; Granville, Fran // EDN;10/10/96, Vol. 41 Issue 21, p24 

    Introduces various analog-to-digital converters (ADC) and digital-to-analog converters (DAC). Signal Processing Technologies Inc.'s SPT9712 and SPT9713 high-speed DACs; Analog Devices Inc.'s AD9057 and AD9059 ADCs; Philips Semiconductors' TDA8762A and TDA8763A ADCs.

  • A grounding philosophy for mixed-signal systems. Kester, Walt // Electronic Design;06/23/97 Supplement, Vol. 45 Issue 13, p29 

    Presents information on the use of mixed-signal devices. What signal-processing systems require; Reference to the mixed-signal devices analog-to-digital converters (ADCs) and digital-to-analog converters (DACs); How sampling ADCs with internal sample-and-hold circuits operate.

  • Designing with temperature sensors, part three: RTDs. BAKER, BONNIE // EDN;11/17/2011, Vol. 56 Issue 22, p24 

    The article discusses how to design a resistance-temperature-detector (RTD) circuit with temperature sensors. According to the author, the constant 0.00385Ω/Ω/°C can be used to approximate the resistance change over temperature for a platinum RTD element. An example for implementing an...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics