Electron emission from slow Ar[sup 17+] ions interacting with a Si surface

Stolterfoht, N.; Hoffmann, V.; Niemann, D.; Bremer, J.-H.
February 2000
AIP Conference Proceedings;2000, Vol. 500 Issue 1, p646
Academic Journal
Experimental and theoretical methods were used to study the formation of hollow atoms during the interaction of Ar[sup 17+] projectiles with a Si(111) surface. Electron spectra were taken in a wide range of projectile energies from 17 eV to 170 keV. Peak structures due to K- and L-Auger electrons were found to vary significantly with the projectile energy. The angular dependence of the Auger electron intensities were interpreted by means of model calculations yielding information about the decay depth of the hollow atoms within the first layers of the surface. © 2000 American Institute of Physics.


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