Coincidence measurements of highly charged ions interacting with surfaces

Lemell, C.; Sto¨ckl, J.; Burgdo¨rfer, J.; Betz, G.; Winter, H. P.; Aumayr, F.
February 2000
AIP Conference Proceedings;2000, Vol. 500 Issue 1, p656
Academic Journal
We have measured electron emission yields for multiply charged ions impinging on clean Au(111) and LiF(100) surfaces under varying incidence angles ψ ranging from 3° to 45°. For small angles of incidence we also recorded the impact position of scattered projectiles on a two dimensional detector using the coincidence technique. A clear separation of potential and kinetic electron emission becomes possible and provides insight in electron emitting processes involved in the neutralization dynamics in ion-surface interaction. Model calculations simulating electron emission at and below the surface support our interpretation of the data. © 2000 American Institute of Physics.


Related Articles

  • Single and double electron capture processes in slow Ne[sup q+]�He (q=10, 6) collisions. Nikulin, V. K.; Gushchina, N. A. // Technical Physics;Jan99, Vol. 44 Issue 1, p12 

    The cross sections for single and double electron capture to the states Ne[sup 9+](n) with n=3�6 and Ne[sup 8+](3l,n[sup ']l[sup ']),Ne[sup 8+](4l,n[sup ']l[sup ']) with n[sup ']>=4 and also the cross sections for single electron capture to the states Ne[sup 5+](3) in collisions of Ne[sup...

  • Charge-changing reactions and their influence on the ion motion in a Penning trap. Herlert, A.; Schweikhard, L.; Vogel, M. // AIP Conference Proceedings;2002, Vol. 606 Issue 1, p652 

    Charge-changing reactions can lead to a significant change of the ion motion which may result in the loss of the ions from the trap. For the present experiments singly charged gold clusters from an external laser vaporization source have been transferred into a Penning trap and transformed into...

  • Leaping Electrons! Hicks, Mark // Ask;Mar2012, Vol. 11 Issue 3, p10 

    The article offers information on electrons, including how it travels.

  • Dissociative recombination of NO[sup +]: Dynamics of the X [sup 1]Σ[sup +] and a [sup 3]Σ[sup +] electronic states. Hellberg, Fredrik; Rosén, Stefan; Thomas, Richard; Neau, Anita; Larsson, Mats; Petrignani, Annemieke; van der Zande, Wim J. // Journal of Chemical Physics;4/8/2003, Vol. 118 Issue 14, p6250 

    We have studied the dissociation dynamics of NO[SUP+] ions in their ground, X[SUP1]∑[SUP+], and first excited metastable, a [SUP3]∑[SUP+] states, induced by the capture of electrons of variable collision energy in the dissociative recombination (DR) process. The branching over the...

  • Generation of currents in gases by fast, highly charged ions. Voıtkiv, A. B.; Krakov, B. G. // Technical Physics;Sep98, Vol. 43 Issue 9, p1028 

    It is shown that an exit asymmetry of the electrons and recoil ions formed during ionization of atoms in elementary collision events with fast, highly charged ions can give rise to macroscopic electron and recoil ion currents during the bombardment of a gaseous target by a beam of fast, highly...

  • Difference in the behavior of oxygen deficient defects in Ge-doped silica optical fiber preforms... Essid, M.; Brebner, J.L. // Journal of Applied Physics;10/15/1998, Vol. 84 Issue 8, p4193 

    Presents a study reporting on the difference in the transformation process of the neutral oxygen monovacancy and the germanium lone pair center (GLPC), into electron trap centers associated with fourfold coordinated ions and Ge-E' centers. Methodology used to conduct the study; Description of...

  • Experimental and computational analysis of ionized cluster beam deposition. Turner, Dave; Shanks, Howard // Journal of Applied Physics;11/15/1991, Vol. 70 Issue 10, p5385 

    Presents a study that analyzed Eaton ionized cluster beam source involving computer calculation of the potential fields and computer simulation of the electrons and ions. Background on ionized cluster beam deposition; Diagram of Eaton ionized cluster beam source illustrating the time-of-flight...

  • Increased ion intensity and reliability of the Stockholm electron beam ion sourcea). Beebe, E.; Liljeby, L.; Pikin, A.; Björkhage, M.; Engström, Å.; Paal, A. // Review of Scientific Instruments;May94, Vol. 65 Issue 5, p1718 

    The electron beam ion source, CRYSIS, produces highly charged ions for injection into the heavy ion storage ring—CRYRING at MSL, as well as low energy atomic physics experiments and the Stockholm-Mainz Penning trap recently installed at MSL. CRYSIS has produced ions up to Ar[sup 18+] and...

  • Investigations of the emittance and brightness of ion beams from an electron beam ion source of the Dresden EBIS type. Silze, Alexandra; Ritter, Erik; Zschornack, Günter; Schwan, Andreas; Ullmann, Falk // Review of Scientific Instruments;Feb2010, Vol. 81 Issue 2, p023303 

    We have characterized ion beams extracted from the Dresden EBIS-A, a compact room-temperature electron beam ion source (EBIS) with a permanent magnet system for electron beam compression, using a pepper-pot emittance meter. The EBIS-A is the precursor to the Dresden EBIS-SC in which the...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics