TITLE

Coincidence measurements of highly charged ions interacting with surfaces

AUTHOR(S)
Lemell, C.; Sto¨ckl, J.; Burgdo¨rfer, J.; Betz, G.; Winter, H. P.; Aumayr, F.
PUB. DATE
February 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 500 Issue 1, p656
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have measured electron emission yields for multiply charged ions impinging on clean Au(111) and LiF(100) surfaces under varying incidence angles ψ ranging from 3° to 45°. For small angles of incidence we also recorded the impact position of scattered projectiles on a two dimensional detector using the coincidence technique. A clear separation of potential and kinetic electron emission becomes possible and provides insight in electron emitting processes involved in the neutralization dynamics in ion-surface interaction. Model calculations simulating electron emission at and below the surface support our interpretation of the data. © 2000 American Institute of Physics.
ACCESSION #
6029842

 

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