TITLE

Low-frequency noise, a practical tool to assess reliability of laser diodes?

AUTHOR(S)
Chen, X. Y.; van Rheenen, A. D.
PUB. DATE
March 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 511 Issue 1, p488
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Measurements of low-frequency electrical noise (LFN) in commercially available laser diodes, an index guided AlGaInP diode lasing at 635 nm (SDL3038-11) and an InGaAlP-multiquantum well diode lasing at 670 nm (SVL71B), have been conducted. In particular the effect of stress (high current and high temperature) on the noise is investigated. We compared the noise spectra, light output power and current-voltage dependence measured before and after stress step. Our results give rise to a question: can low-frequency noise measurement be a practical diagnostic tool for assessing reliability of laser diodes? © 2000 American Institute of Physics.
ACCESSION #
6029539

 

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