TITLE

High-resolution x-ray imaging for microbiology at the Advanced Photon Source

AUTHOR(S)
Lai, B.; Kemner, K. M.; Maser, J.; Schneegurt, M. A.; Cai, Z.; Ilinski, P. P.; Kulpa, C. F.; Legnini, D. G.; Nealson, K. H.; Pratt, S. T.; Rodrigues, W.; Lee Tischler, M.; Yun, W.
PUB. DATE
February 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 506 Issue 1, p585
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Exciting new applications of high-resolution x-ray imaging have emerged recently due to major advances in high-brilliance synchrotron sources and high-performance zone plate optics. Imaging with submicron resolution is now routine with hard x-rays: we have demonstrated 150 nm in the 6–10 keV range with x-ray microscopes at the Advanced Photon Source (APS), a third-generation synchrotron radiation facility. This has fueled interest in using x-ray imaging in applications ranging from the biomedical, environmental, and materials science fields to the microelectronics industry. One important application we have pursued at the APS is a study of the microbiology of bacteria and their associated extracellular material (biofilms) using fluorescence microanalysis. No microscopy techniques were previously available with sufficient resolution to study live bacteria (approx. 1 μm×4 μm in size) and biofilms in their natural hydrated state with better than part-per-million elemental sensitivity and the capability of determining chemical speciation. In vivo x-ray imaging minimizes artifacts due to sample fixation, drying, and staining. This provides key insights into the transport of metal contaminants by bacteria in the environment and potential new designs for remediation and sequestration strategies. © 2000 American Institute of Physics.
ACCESSION #
6029477

 

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