A novel type of x-ray interferometer

Kettig, O.; Backe, H.; Clawiter, N.; Dambach, S.; Doerk, Th.; Elbai, N.; Euteneuer, H.; Hagenbuck, F.; Holl, P.; Jacobs, H.; Kaiser, K.-H.; Kemmer, J.; Kerschner, Th.; Kube, G.; Koch, H.; Lauth, W.; Mannweiler, H.; Mattha¨y, H.; Scho¨pe, H.; Schroff, D.
February 2000
AIP Conference Proceedings;2000, Vol. 506 Issue 1, p669
Academic Journal
Novel types of interferometers have been developed at the Mainz Microtron MAMI with which the complex index of refraction of thin self-supporting foils can be measured. For the vacuum ultraviolet and soft x-ray region the interferometer consists of two collinear undulators, between which a foil can be placed, and a grating spectrometer. For the hard x-ray region, up to an energy of about 40 keV, it consists of two foils in which the electron beam produces transition radiation, and a single crystal spectrometer in Bragg geometry. Taking advantage of the low emittance 855 MeV electron beam distinct intensity oscillations have been observed as a function of the distance between the undulators and foils, respectively. The complex index of refraction has been investigated at the K- and L-absorption edges of carbon and nickel. © 2000 American Institute of Physics.


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