TITLE

Maintaining a carbon free beamline with in situ cleaning

AUTHOR(S)
Hansen, Roger W. C.; Umhoefer, Jason
PUB. DATE
June 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 521 Issue 1, p128
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Carbon contamination of beamline components is an old problem for synchrotron radiation users. Although tremendous precautions are taken to avoid contamination, mirrors and gratings rapidly accumulate a layer of carbon contamination. This contamination decreases flux above the carbon edge and can cause a precipitous loss of flux at the edge. The unknown variation in flux makes detailed studies of the carbon edge difficult and in some cases impossible. UV/Ozone cleaning has been used to successfully remove carbon deposits and restore optics to usable condition. In this work, we have installed UV/Ozone cleaning lamps permanently into the beamline. The system can be vented to dry air and the optics cleaned for several hours on a routine basis. This system can totally eliminate carbon absorption from the beamline and appears to inhibit further contamination. © 2000 American Institute of Physics.
ACCESSION #
6029401

 

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