Design and performance of x-ray optics optimized for polycrystalline microdiffraction

Ice, G. E.; Chung, J.-S.; Larson, B. C.; Budai, J. D.; Tischler, J. Z.; Tamura, N.; Lowe, W.
June 2000
AIP Conference Proceedings;2000, Vol. 521 Issue 1, p19
Academic Journal
The design considerations are described for a new class of instrumentation optimized for x-ray microdiffraction measurements of polycrystalline amples. A prototype station on the MHATT-Cat beamline 7 at the Advanced Photon Source is used to illustrate the current level of performance of this instrumentation. This station allows for efficient measurements of x-ray microdiffraction from polycrystalline materials with submicron spatial resolution and with strain resolution below 1 part in 10[sup 4]. The station utilizes a specially designed monochromator/non-dispersive Kirkpatrick-Baez focusing system that allows for rapid oscillation between monochromatic and white beam conditions. This allows the deviatoric and full strain tensors of polycrystalline grains to be rapidly determined. © 2000 American Institute of Physics.


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