A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler

Assoufid, Lahsen; Her, Peng
June 2000
AIP Conference Proceedings;2000, Vol. 521 Issue 1, p225
Academic Journal
A simple device composed of a modular double-pentaprism system that enables the long trace profiler (LTP) to measure mirrors in nonconventional ways, i.e., in the vertical-downward and sideways positions, has been devised and implemented in the Advanced Photon Source (APS) long trace profiler (LTP II). The systems is very useful in calibrating mirror-bender assemblies. This paper describes the system and gives results of measurements performed with it on a mirror used at the APS. © 2000 American Institute of Physics.


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