TITLE

Far-Infrared Reflection Absorption Spectroscopy: Low frequency studies on single-crystal oxide surfaces

AUTHOR(S)
Pilling, M.; He, T.; Hirschmugl, C.
PUB. DATE
June 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 521 Issue 1, p41
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Synchrotron-based Far-IR Reflection Absorption Spectroscopy (Far-IRAS) is ideal for investigating low energy dynamics at surfaces. In particular, bonding modes between an adsorbate and substrate typically lie below 1000 cm-1 and are more sensitive to the local geometrical and electronic structures. A bright synchrotron source affords the ability to investigate these low frequency modes at high resolution for restrictive experimental (throughputs) geometries. Furthermore, a grazing incidence geometry with a limited throughput is necessary to gain information about the bonds at the adsorbate/substrate interface especially for substrates that absorb infrared light. This technique, proven in studies of adsorbate/metal interfaces, is extended to study the interface between adsorbates and oxide substrates. Two approaches to this class of experiments will be introduced and the intrinsic noise limitations of each will be discussed. © 2000 American Institute of Physics.
ACCESSION #
6029338

 

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