TITLE

A 35 GHz vector system for non destructive applications

AUTHOR(S)
Glay, D.; Lasri, T.; Mamouni, A.; Leroy, Y.
PUB. DATE
May 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 509 Issue 1, p579
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
It has been demonstrated that microwave techniques are well suited for nondestructive testing (NDT) of materials. The challenge now is to propose systems that can compete, in terms of reliability, precision and fabrication cost, with those already existing. Microwaves are expected to play a fundamental role if we are able to develop both methods and systems to fulfill the increasing demand of characterization in this dynamic field. We have developed devices operating at 2.45 and 10 GHz that have been used successfully for layer thickness and material parameters (permittivity, moisture,...) measurement. In order to tackle other problems met by the NDT community, that need to operate at higher frequencies we have conceived a sensor for the determination of the material under test reflection coefficient (magnitude and phase) at 35 GHz. This system conceived around a complex correlator (or IQ demodulator), made in microstrip technology, is used for the detection of flaws inside dielectric materials or on surface conductors. These investigations concern defects with various shapes, sizes, and dielectric properties. © 2000 American Institute of Physics.
ACCESSION #
6029079

 

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