TITLE

Modulated optical reflectance NDE of superconducting thin film microwave devices

AUTHOR(S)
Almond, D. P.; Nokrach, P.; Stokes, E. W. R.; Porch, A.; Foulds, S. A. L.; Wellhofer, F.; Powell, J. R.; Abell, J. S.
PUB. DATE
May 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 509 Issue 1, p627
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
It has been demonstrated that the room temperature modulated optical reflectance (MOR) signal from high temperature superconducting (HTS) thin film material with good superconducting characteristics is much higher (approx. 20 times) than from poor under-doped HTS material. The differences between the films were produced by adjusting deposition conditions in a fashion known to result in films of higher or lower oxygen content and consequently higher or lower free carrier concentration. A preliminary investigation has been made of the suitability of MOR for the inspection of HTS microwave resonators which are produced by creating resonant structures lithographically in HTS thin film. It has been shown that the MOR technique can reveal superconducting defects that may be the cause of the anomalous non-linear characteristics of these resonators that are a major obstacle to their commercial application. Results will be presented to show the correlation between: room temperature MOR images of resonators; the spatial variations in their HTS properties and their microwave performances. MOR appears to have great potential as a nondestructive evaluation technique for HTS thin film devices because it is non-contacting and it provides high resolution information about low temperature superconducting properties from inspections made at room temperature. © 2000 American Institute of Physics.
ACCESSION #
6029071

 

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