A new application of PVDF line-focus transducers on measuring dispersion curves of a layered medium

Lee, Yung-Chun; Ko, Shin-Pin
May 2000
AIP Conference Proceedings;2000, Vol. 509 Issue 1, p945
Academic Journal
In the past few years, PVDF line-focus acoustic transducers have been proven to be a useful and convenient tool for accurately measuring surface wave velocity. The transducer is very easy to construct and the measurement system can be readily established with conventional ultrasonic instruments. In this investigation, however, the capability of PVDF line-focus transducers will be further extended to the measurement of dispersion relation of surface acoustic waves of a layered medium. To achieve this, a number of line-focus transducers are first fabricated with PVDF films of various thickness so that they can operate at different frequencies. Experimental testing on these transducers shows that surface acoustic waves of frequency ranging from 2 MHz to 20 MHz can be effectively generated and detected. For the determination of surface wave velocity as a function of frequency, a new method of processing the measured waveforms during a z-direction defocusing measurements is developed. A mathematical model is given to explain how this method works. With the transducers and the analyzing method, the surface wave dispersion relation of a layer/substrate configuration have been experimentally determined. Samples include thick polymeric films as well as metal films deposited on glass, aluminum, and silicon crystal. Possibility of determining material properties of the layers from the measured dispersion curves will be discussed. © 2000 American Institute of Physics.


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