Reducing low-frequency residual motion in vibration isolation to the nanometre level

Winterflood, J.; Zhou, Z. B.; Blair, D. G.
June 2000
AIP Conference Proceedings;2000, Vol. 523 Issue 1, p325
Academic Journal
If the low frequency residual motion of a vibration isolated test mass can be reduced to the nanometre level, then the forces required to control its position may be applied directly to the test mass without injecting noise and the control and acquisition of lock in an interferometer is rendered trivial. We show that two stages of already demonstrated pre-isolation elements, combined with tilt control and a novel self-damped isolator structure, are capable of achieving this performance. The designs and performance requirements of the individual components making up this system are discussed and various experimental measurements presented. © 2000 American Institute of Physics.


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