Defects induced by gamma irradiation in silica

Agnello, S.; Boscaino, R.; Cannas, M.; Gelardi, F. M.
April 2000
AIP Conference Proceedings;2000, Vol. 513 Issue 1, p7
Academic Journal
We report an electron spin resonance study of the defects induced by γ irradiation in silica. By comparing various materials and by studying the defect growth as a function of the accumulated γ dose, interesting hints are found on the defect origin. © 2000 American Institute of Physics.


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