TITLE

Stable bit formation in polyimide Langmuir–Blodgett film using an atomic force microscope

AUTHOR(S)
Yano, K.; Ikeda, T.
PUB. DATE
February 2002
SOURCE
Applied Physics Letters;2/11/2002, Vol. 80 Issue 6, p1067
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Nanometer scale recording bits were stably fabricated in polyimide (PI) Langmuir–Blodgett (LB) films on atomically flat Au (111) surfaces using an atomic force microscope (AFM). The bits are written by voltage application through the AFM probe only until the conductance increases. This method eliminates the influence of the variation in the transition time and therefore the degradation of the tip of the probe. 1 Mbit stable writing can be realized. The overall error rate is less than 2×10[sup -3]. The results show that an AFM based memory system with PI LB films is a hopeful candidate to realize a scanning probe microscope based memory system. © 2002 American Institute of Physics.
ACCESSION #
6005453

 

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