Defects induced in fused silica by high fluence ultraviolet laser pulses at 355 nm

Stevens-Kalceff, M. A.; Stesmans, A.; Wong, Joe
February 2002
Applied Physics Letters;2/4/2002, Vol. 80 Issue 5, p758
Academic Journal
Point defects induced at the exit surface of optical-grade fused silica by high power (>30 J/cm[sup 2]) 355 nm laser pulses have been investigated to elucidate the nature of laser damage in optics for use at high peak powers (>2 GW/cm[sup 2]). Six defects have been identified. E[sup ′][sub γ] and E[sup ′][sub 74] defects were identified using electron spin resonance spectroscopy. The nonbridging oxygen hole center, a self-trapped exciton, an oxygen-deficient center, and interstitial O[sub 2] were identified and spatially resolved in the damage craters using cathodoluminescence microanalysis. The defects are associated with the laser generated shock waves and/or thermal explosion. © 2002 American Institute of Physics.


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