Time- and space-resolved optical probing of the shock rise time in thin aluminum films

Moore, D. S.; Gahagan, K. T.; Buelow, S. J.; Rabie, R. L.; Funk, D. J.; Sheffield, S. A.; Davis, L. L.; Lippert, T.; Brand, H.; Nicholson, J. W.
April 2000
AIP Conference Proceedings;2000, Vol. 505 Issue 1, p1003
Academic Journal
The time resolution of most common methods (various forms of interferometry, e.g. VISAR, Fabry-Perot, ORVIS) used to measure the free surface particle velocity as a shock exits from a shocked material is from a few ns down to about 200 ps. Dlott et al. have recently obtained a shock rise time resolution of about 25 ps using a method involving singular value decomposition of coherent anti-Stokes Raman (CARS) spectra from thin film nanogauges. We are using frequency domain interferometric methods utilizing 120 fs pulses from a chirped-pulse amplified Ti:sapphire laser to measure the particle velocity rise time as a shock (driven by ca. 0.5 mJ pulses focussed to 75 μm diameter) exits the free surface of 0.5-2 μm aluminium films on thin glass substrates, following the example of Evans, et al. Some preliminary results of these investigations are reported.


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