Self-affine analysis on curved reference surfaces: Self-affine fractal characterization of a TNT surface

Meisel, L. V.; Scanlon, R. D.; Johnson, M. A.; Lanzerotti, Y. D.
April 2000
AIP Conference Proceedings;2000, Vol. 505 Issue 1, p727
Academic Journal
A trinitrotoluene (TNT) fracture surface image is characterized in terms of a self-affine fractal structure. The fracture surface was produced by high acceleration in an ultracentrifuge when the TNT strength was exceeded. An atomic force microscope (AFM) captured the topography of a 4 micron square region on the fracture surface. The present analysis supports a self-affine fractal description of the TNT fracture surface (wavelengths of 0.016 micron to 4.0 micron) and provides a new perspective on fracture processes in TNT. An essential step in self-affine fractal characterization of surfaces is the determination of reference surfaces. A self-affine fracture surface can be described in terms of a single-valued height function. In the TNT fracture surface, single-valued height functions, which describe surface texture, can only be defined with respect to curved reference surfaces. By employing curved reference surfaces, we have demonstrated that self-affine fractal scaling can be used to characterize the TNT fracture surface. This provides important information that is not evident in the analysis of individual surface scans.


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