Thermoelectric properties of Bi[sub 2(1-x)]In[sub 2x]Te[sub 3] ternary samples

Nagao, Jiro; Ferhat, Marhoun
January 2000
AIP Conference Proceedings;2000, Vol. 504 Issue 1, p1494
Academic Journal
Low temperature thermoelectric properties of Bi[sub 2(1-x)]In[sub 2x]Te[sub 3] ternary samples have been measured in the 50–300 K temperature range. At room temperature, the thermal conductivity decreases with increasing In[sub 2]Te[sub 3] content, reaches a minimum at x=0.2 and then slightly increases with increasing In[sub 2]Te[sub 3] concentration. For x=0.1 and x=0.2 samples, the thermal conductivity varies approximately as 1/T, which may indicate that the defect scattering with phonon is predominant to thermal conduction. Seebeck coefficient and electrical resistivity have been measured and the thermoelectric figure merit calculated. The maximum value obtained is ZT=0.5 around 300 K, a value comparable to those of state-of-the-art thermoelectric semiconductors. From x-ray diffraction measurements, it is found that these samples are composites with In[sub 2]Te[sub 3] particles in Bi[sub 2]Te[sub 3]. In this case, the phonons would be scattered by the inclusion particles, depending on their size which is critical for achieving an increase in ZT compare to Bi[sub 2]Te[sub 3]. An increase in ZT could be achieved for an optimal particle size of In[sub 2]Te[sub 3]. © 2000 American Institute of Physics.


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