Performance of Y2O3/Al multilayer coatings for the He-II radiation at 30.4 nm

Murakami, Go; Sakai, Kouichi; Homma, Tatsuro; Yoshioka, Kazuo; Yoshikawa, Ichiro; Ichimaru, Satoshi; Takenaka, Hisataka
March 2011
Review of Scientific Instruments;Mar2011, Vol. 82 Issue 3, p033106
Academic Journal
We briefly report on the performance and stability of periodic multilayer mirrors containing Y2O3 and Al layers designed for normal incidence reflection at the He-II emission line (30.4 nm). We found that Y2O3/Al multilayer coatings had higher reflectivity (24.9%) at 30.4 nm and significantly lower reflectivity (1.3%) at 58.4 nm than the conventional coatings such as Mo/Si. Furthermore, we investigated the temporal stability of the Y2O3/Al multilayer coatings. Our sample was kept under vacuum, dry N2 purge, and normal atmosphere for over three months, and there were no measurable changes in the reflectivity. These results suggest that we can use Y2O3/Al multilayer coatings as standard mirrors for the He-II radiation.


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