TITLE

INFRARED REFLECTANCE OF POROUS GaP

AUTHOR(S)
Treideris, M.; Šimkienė, I.; Kašalynas, I.; Selskis, A.; Babonas, J.
PUB. DATE
October 2010
SOURCE
International Conference: Radiation Interaction with Material & ;2010, p118
SOURCE TYPE
Conference Paper
DOC. TYPE
Article
ABSTRACT
The reflectance of porous GaP layers on GaP substrates has been investigated in the frequency range 300-500 cm-1 by Fourier transform infrared (FTIR) reflectance spectroscopy. Porous GaP layers were fabricated by anodic electrochemical etching technique. The structure of porous layers formed by using various electrolytes was studied by SEM technique. The correlation between particular features in the infrared reflection spectra in reststrahlen region and morphology of porous layers was analyzed and discussed.
ACCESSION #
59351134

 

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