Improved surface imaging with a near-field scanning microwave microscope using a tunable resonator

Hong, Sunghyuk; Kim, Jooyoung; Park, Wonkyun; Lee, Kiejin
January 2002
Applied Physics Letters;1/21/2002, Vol. 80 Issue 3, p524
Academic Journal
We report a microwave surface imaging technique using a near-field scanning microwave microscope with a tunable resonance cavity. By tuning the resonance cavity, we could demonstrate improved sensitivity and spatial resolution of the topographic image of YBa[sub 2]Cu[sub 3]O[sub y] thin films on MgO substrates. By measuring the shift of resonant frequency and the change of quality factor, we obtained near-field scanning microwave images with a spatial resolution better than 4 μm at an operating frequency of f=1–1.5 GHz. The principal of operation could be explained by the perturbation theory of a coaxial resonant cavity, considering the radius of the probe tip, the sample–tip distance, and the impedance matching. © 2002 American Institute of Physics.


Related Articles

  • Influence of a controllable scatterer on the lasing properties of an ultralow threshold Raman microlaser. Mazzei, A.; Krauter, H.; Benson, Oliver; Götzinger, Stephan // Applied Physics Letters;9/4/2006, Vol. 89 Issue 10, p101105 

    The authors investigate Raman lasing in a spherical high-Q glass microresonator with the help of a near-field optical scanning probe. Scattered photons are utilized to perform mode mapping of both pump and lasing modes. Single mode lasing with a record low threshold of 4.3 μW is observed....

  • Direct imaging of submicron-scale defect-induced birefringence in SrTiO3 bicrystals. McDaniel, E.B.; Hsu, J.W.P. // Journal of Applied Physics;7/1/1998, Vol. 84 Issue 1, p189 

    Presents information on the mapping of the anistropic strain fields associated with individual submicron defects, through the use of the near-field scanning optical microscope capable of quantitative polarimetry. Exhibition of many defects; Assistance of direct observation of these...

  • Near-field probe maps optoelectronic device photoconductivity.  // Laser Focus World;Jan95, Vol. 31 Issue 1, p9 

    Reports on AT&T Bell Laboratories scientists' development of a scanning optical microscopy method that uses near-field radiation to produce maps of minority carrier transport in optoelectronic devices, such as multiple-quantum-well (MQW) lasers, with a resolution of 250 nanometer. Delineation...

  • Facts and artifacts in near-field optical microscopy. Hecht, B.; Bielefeldt, H. // Journal of Applied Physics;3/15/1997, Vol. 81 Issue 6, p2492 

    Reports that near-field optical (NFO) microscopes with an auxiliary gap width regulation may produce images that represent the path of the probe rather than optical properties of the sample. Examples of Z-motion artifacts; Mechanisms by which the auxiliary gap-width control can induce...

  • Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the... Sandoghdar, V.; Wegscheider, S. // Journal of Applied Physics;3/15/1997, Vol. 81 Issue 6, p2499 

    Examines the optical resolution of a scanning near-field optical microscope in reflection collection mode using an uncoated fiber tip. Apparent resolution in the optical signal as a topography-induced effect; Pure optical resolution of the setup presented.

  • Interest is strong in near-field optics research. Paesler, Michael // Laser Focus World;Jan94, Vol. 30 Issue 1, p28 

    Reports on the Second International Conference on Near-Field Optics (NFO-2), which was held in September 1993, at North Carolina State University in Raleigh, North Carolina. Number of scientists who attended; Presentation of work on experimental or theoretical consideration of subwavelength...

  • Theory of scanning near-field magnetooptical microscopy. Kosobukin, V. A. // Technical Physics;Jul98, Vol. 43 Issue 7, p824 

    An analytical theory of scanning near-field magnetooptical microscopy is developed. The theory is based on the elastic scattering of light by small, resonantly polarizable particles, which are used to scan the plane surface of a nonuniformly magnetized medium. The effective polarizability of the...

  • A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope Wurtz, G.; Bachelot, R.; Royer, P. // Review of Scientific Instruments;Apr98, Vol. 69 Issue 4, p1735 

    Develops a polyvalent reflection-mode apertureless scanning near-field optical microscope (SNOM) from a commercial scanning probe microscope. Description of the SNOM device; Types of reflection mode SNOM configurations; Types of SNOM probes.

  • Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers. Held, T.; Emonin, S.; Marti, O.; Hollricher, O. // Review of Scientific Instruments;Aug2000, Vol. 71 Issue 8 

    A new two-step method to fabricate scanning near-field optical microscope (SNOM) probes with an aperture size clearly below 100 nm has been developed. For the first step, a chemical etching process is used in which an optical fiber is dipped with its acrylate jacket into hydrofluoric acid to get...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics