TITLE

A high-vacuum deposition system for in situ and real-time electrical characterization of organic thin-film transistors

AUTHOR(S)
Quiroga, Santiago David; Shehu, Arian; Albonetti, Cristiano; Murgia, Mauro; Stoliar, Pablo; Borgatti, Francesco; Biscarini, Fabio
PUB. DATE
February 2011
SOURCE
Review of Scientific Instruments;Feb2011, Vol. 82 Issue 2, p025110
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We present a home-built high-vacuum system for performing organic semiconductor thin-film growth and its electrical characterization during deposition (real-time) or after deposition (in situ). Since the environment conditions remain unchanged during the deposition and electrical characterization process, a direct correlation between growth mode and electrical properties of thin film can be obtained. Deposition rate and substrate temperature can be systematically set in the range 0.1-10 ML/min and RT-150 °C, respectively. The sample-holder configuration allows the simultaneous electrical monitoring of up to five organic thin-film transistors (OTFTs). The OTFTs parameters such as charge carrier mobility μ, threshold voltage VTH, and the on-off ratio Ion/Ioff are studied as a function of the semiconductor thickness, with a submonolayer accuracy. Design, operation, and performance of the setup are detailed. As an example, the in situ and real-time electrical characterization of pentacene TFTs is reported.
ACCESSION #
58700451

 

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