Erratum: “Interpretation of double x-ray diffraction peaks from InGaN layers” [Appl. Phys. Lett. 79, 1432 (2001)]

Pereira, S.; Correia, M. R.; Pereira, E.; O’Donnell, K. P.; Alves, E.; Sequeira, A. D.; Franco, N.
January 2002
Applied Physics Letters;1/14/2002, Vol. 80 Issue 2, p337
Academic Journal
Provides a corrected reprint to an article previously published in the January 14, 2002 issue of 'Applied Physics Letters.' Details on the interpretation of double x-ray diffraction peaks from InGaN layers.


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