Erratum: 'A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy' [Rev. Sci. Instrum. 81, 093701 (2010)]

Hosokawa, Yoshihiro; Kobayashi, Kei; Oyabu, Noriaki; Matsushige, Kazumi; Yamada, Hirofumi
January 2011
Review of Scientific Instruments;Jan2011, Vol. 82 Issue 1, p019901
Academic Journal
No abstract available.


Related Articles

  • Editorial: Reflections on my tenure as Editor-in-Chief of Review of Scientific Instruments. Macrander, Albert T. // Review of Scientific Instruments;Dec2015, Vol. 86 Issue 12, p1 

    The author provides reflections on his tenure as editor-in-chief of the journal "Review of Scientific Instruments." He recognizes the quality of research and work published by the journal and identifies some of the improvements he has pioneered as the journal's editor since January 2000,...

  • Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy. Passeri, D.; Bettucci, A.; Biagioni, A.; Rossi, M.; Alippi, A.; Lucci, M.; Davoli, I.; Berezina, S. // Review of Scientific Instruments;Jun2008, Vol. 79 Issue 6, p066105 

    An atomic force microscopy (AFM) based technique is proposed for the characterization of both indentation modulus and hardness of compliant materials. A standard AFM tip is used as an indenter to record force versus indentation curves analogous to those obtained in standard indentation tests. In...

  • Invited Article: VEDA: A web-based virtual environment for dynamic atomic force microscopy. Melcher, John; Hu, Shuiqing; Raman, Arvind // Review of Scientific Instruments;Jun2008, Vol. 79 Issue 6, p061301 

    We describe here the theory and applications of virtual environment dynamic atomic force microscopy (VEDA), a suite of state-of-the-art simulation tools deployed on nanoHUB (www.nanohub.org) for the accurate simulation of tip motion in dynamic atomic force microscopy (dAFM) over organic and...

  • Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantilevers. Shiraki, Ichiro; Miyatake, Yutaka; Nagamura, Toshihiko; Miki, Kazushi // Review of Scientific Instruments;Feb2006, Vol. 77 Issue 2, p023705 

    Compared to current optical-lever methods adopted in atomic force microscopes, nonoptical methods such as piezoresistive methods and quartz fork methods can be more advantageous due to their smaller installation size and the lack of electromagnetic effects from laser light during electrical...

  • Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation. Kassies, Roel; van der Werf, Kees O.; Bennink, Martin L.; Otto, Cees // Review of Scientific Instruments;Mar2004, Vol. 75 Issue 3, p689 

    Atomic force microscopy measurements based on optical beam deflection can seriously be affected by two specific types of artifacts. Disturbances of the first type are caused by interference on the quadrant photodiode between the beam reflected directly from the cantilever and stray light from...

  • Control of voice coil motor nanoscanners for an atomic force microscopy system using a loop shaping technique. Youm, Woosub; Jung, Jongkyu; Lee, SungQ; Park, Kyihwan // Review of Scientific Instruments;Jan2008, Vol. 79 Issue 1, p013707 

    The voice coil motor nanoscanner has the advantages of large working range, easy control, and low cost compared to the conventional lead zirconate titanate driven nanoscanner. However, it has a small damping problem which causes mechanical vibration. The mechanical vibration reduces the accuracy...

  • Simultaneous normal and shear measurements of nanoconfined liquids in a fiber-based atomic force microscope. Matei, George; Jeffery, Steve; Patil, Shivprasad; Khan, Shah H.; Pantea, Mircea; Pethica, John B.; Hoffmann, Peter M. // Review of Scientific Instruments;Feb2008, Vol. 79 Issue 2, p023706 

    We have developed an atomic force microscopy (AFM) technique that can perform simultaneous normal and shear stiffness measurements of nanoconfined liquids with angstrom-range amplitudes. The AFM technique is based on a fiber-interferometric, small-amplitude, off-resonance AFM. This AFM is...

  • A serial-kinematic nanopositioner for high-speed atomic force microscopy. Wadikhaye, Sachin P.; Yuen Kuan Yong; Moheimani, S. O. Reza // Review of Scientific Instruments;2014, Vol. 85 Issue 10, p1 

    A flexure-guided serial-kinematic XYZ nanopositioner for high-speed Atomic Force Microscopy is presented in this paper. Two aspects influencing the performance of serial-kinematic nanopositioners are studied in this work. First, mass reduction by using tapered flexures is proposed to increased...

  • Instrument-Dependent Cadherin Monolayer Interactions. Zypman, Fredy // Journal of Biological Physics;Oct2007, Vol. 33 Issue 5-6, p477 

    We introduce two theoretical models for predicting forces between cadherin-coated sphere and plane. The first model is based on a continuum theory previously developed for the interaction of large objects embedded in liquids. The second model takes into account size effects, which are relevant...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics