TITLE

Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy

AUTHOR(S)
Hellgren, Niklas; Guo, Jinghua; Såthe, Conny; Agui, Akane; Nordgren, Joseph; Luo, Yi; Ågren, Hans; Sundgren, Jan-Eric
PUB. DATE
December 2001
SOURCE
Applied Physics Letters;12/24/2001, Vol. 79 Issue 26, p4348
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Soft x-ray absorption (SXAS) and emission (SXES) spectroscopies were applied to study the nitrogen bonding structure in magnetron sputtered CN[sub x] thin films. By comparing with calculated spectra of N in different model systems, N in three main bonding environments can be identified: (i) C=N bonds, with a sharp SXAS peak at 399.5 eV, (ii) pyridine-like N (i.e., N bonded to two C atoms), with an x-ray absorption resonance at ∼398.5 eV, and (iii) N substituted in graphite, possibly with one sp[sup 3] carbon as a neighbor (SXAS energy ∼401 eV). These bondings are present in all CN[sub x] films analyzed; however, as shown earlier, the relative intensities between the peaks may vary with the growth conditions. Differences in the coordination of the nearest or second nearest C neighbors only cause slight changes in the peak positions and spectrum shape. © 2001 American Institute of Physics.
ACCESSION #
5742042

 

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