Multimode quantitative scanning microwave microscopy of in situ grown epitaxial Ba[sub 1-x]Sr[sub x]TiO[sub 3] composition spreads

Chang, K. S.; Aronova, M.; Famodu, O.; Takeuchi, I.; Lofland, S. E.; Hattrick-Simpers, J.; Chang, H.
December 2001
Applied Physics Letters;12/24/2001, Vol. 79 Issue 26, p4411
Academic Journal
We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba[sub 1-x]Sr[sub x]TiO[sub 3] thin-film composition spreads fabricated on (100) LaA1O[sub 3] substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO[sub 3] to SrTiO[sub 3.] We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba[sub 1-x]Sr[sub x]TiO[sub 3] at microwave frequencies. © 2001 American Institute of Physics.


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