TITLE

Systematic measurement of Al[sub x]Ga[sub 1-x]N refractive indices

AUTHOR(S)
Özgür, Ümit; Webb-Wood, Grady; Everitt, Henry O.; Yun, Feng; Morkoç, Hadis
PUB. DATE
December 2001
SOURCE
Applied Physics Letters;12/17/2001, Vol. 79 Issue 25, p4103
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic Al[sub x]Ga[sub 1 − x]N epitaxial layers with 0.0 ≤ x ≤ 1.0 throughout the visible wavelength region. The dispersion, measured by a prism coupling waveguide technique, is found to be well described by a Sellmeier relation. Discrepancies among previous measurements of refractive index dispersion, as a consequence of different growth conditions and corresponding band gap bowing parameter, are reconciled when the Sellmeier relation is parameterized not by x but by band gap energy. © 2001 American Institute of Physics. [DOI: 10.1063/1.1426270].
ACCESSION #
5669596

 

Related Articles

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics