Diagnostics of surface layer disordering using optical third harmonic generation of a circular polarized light

Yakovlev, V. V.; Govorkov, S. V.
December 2001
Applied Physics Letters;12/17/2001, Vol. 79 Issue 25, p4136
Academic Journal
A nonlinear optical technique based on a third-harmonic generation of a circular polarized light is proposed for the diagnostics of order-disorder transformations in semiconductors. Applications of this technique to study both noncentrosymmetric (GaAs) and centrosymmetric (Si) materials are demonstrated. © 2001 American Institute of Physics. [DOI: 10.1063/1.1427425].


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