TITLE

Local structure analysis of GaAs:Zn by X-ray fluorescence holography using multi-element SSD

AUTHOR(S)
Hayashi, K.; Matsui, M.; Awakura, Y.; Kaneyoshi, T.; Tanida, H.; Ishii, M.
PUB. DATE
February 2001
SOURCE
AIP Conference Proceedings;2001, Vol. 554 Issue 1, p498
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
X-ray fluorescence holography is a technique which can record the amplitude and phase of X-rays scattered by atoms and directly provide three dimensional atomic image of an environment around the atoms, emitting the fluorescence. We used this method to image the local atomic environment of Zn atoms doped in a GaAs wafer using synchrotron radiation and a multi-element solid state detector. The first two neighbor atomic image on (001) plane were successfully obtained, revealing that the Zn atoms occupied substitutional site.
ACCESSION #
5665471

 

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