TITLE

Experimental and computational investigations of the fractal pattern formation in the metal/semiconductor bilayer films

AUTHOR(S)
Koyama, T.; Doi, M.
PUB. DATE
June 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 519 Issue 1, p185
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
© 2000 American Institute of Physics.
ACCESSION #
5665076

 

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