Spectromicroscopy of catalytic relevant processes with sub-micron resolution

Gu¨nther, S.; Esch, F.; Gregoratti, L.; Marsi, M.; Kiskinova, M.; Schubert, U. A.; Grotz, P.; Kno¨zinger, H.; Taglauer, E.; Schu¨tz, E.; Schaak, A.; Imbihl, R.
May 2000
AIP Conference Proceedings;2000, Vol. 507 Issue 1, p219
Academic Journal
The capabilities of the Scanning Photo Electron Microscope (SPEM) at ELETTRA as a unique probing tool in the field of catalysis and surface science are illustrated presenting results of two recent investigations. The lateral resolution and the high surface sensitivity of the SPEM has enabled imaging the initial steps of the spreading processes of MoO[sub 3] crystals on an alumina support surface, a model system of a catalyst used in petrochemistry. In the second study the local adsorbate coverage inside a pulse of a chemical wave occurring in the catalytic NO + H[sub 2] reaction on a Rh(110) single crystal surface has been determined. The microscope was used to monitor the sample surface in situ during the reaction and thus characterizing a temporal and spatial inhomogeneous system. The so-called excitation cycle of the pulse formation has been verified and the adsorbate gradient inside a chemical wave was measured.


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