TITLE

Principal component analysis for soft x-ray spectromicroscopy

AUTHOR(S)
Osanna, Angelika; Jacobsen, Chris
PUB. DATE
May 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 507 Issue 1, p350
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A principal component analysis approach to extract thickness maps from spectromiscroscopic image stacks is described and illustrated with a model calculation.
ACCESSION #
5664405

 

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