Demonstration of phase contrast in scanning transmission X-ray microscopy: Comparison of images obtained at NSLS X1-A with numerical simulations

Polack, Franc¸ois; Joyeux, Denis; Feser, Michael; Phalippou, Daniel; Carlucci-Dayton, Mary; Kaznacheyev, Konstantyn; Jacobsen, Chris
May 2000
AIP Conference Proceedings;2000, Vol. 507 Issue 1, p573
Academic Journal
Unlike transmission X-ray microscopy, scanning transmission X-ray microscopy (STXM), till now, does not allow phase contrast. Several method have been suggested but no proof of practical feasibility has been yet given. Here we analyze the methods based on the detection of the small beam deflection induced by the object phase gradient, by a segmented detector. It is shown that structuring the zone plate illumination potentially improves the detection. A diffractive beam profiler has been constructed to condition the beam of the NSLS X1A STXM. Recent images are shown, which, compared to numerical simulations, indicate the presence of phase contrast.


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