TITLE

Extending the methodology of X-ray crystallography to allow X-ray microscopy without X-ray optics

AUTHOR(S)
Miao, Jianwei; Charalambous, Pambos; Kirz, Janos; Sayre, David
PUB. DATE
May 2000
SOURCE
AIP Conference Proceedings;2000, Vol. 507 Issue 1, p581
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We demonstrate that the soft X-ray diffraction pattern from a micron-size noncrystalline specimen can be recorded and inverted to form a high-resolution image. The phase problem is overcome by oversampling the diffraction pattern, The image is obtained using an iterative algorithm. The technique provides a method for X-ray microscopy requiring no high-resolution X-ray optical elements or detectors. In the present work, a resolution of approximately 60 nm was obtained, but we believe that considerably higher resolution can be achieved.
ACCESSION #
5664354

 

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