Analysis of strain anisotropy in delta stabilized Pu-Ga alloys

Morales, Luis; Lawson, Andrew; Kennison, John
July 2000
AIP Conference Proceedings;2000, Vol. 532 Issue 1, p125
Academic Journal
Optimal extraction of information from powder diffraction patterns requires an accurate description of the diffraction line shape. Most refinement techniques, such as Rietveld, treat the diffraction line width as a smooth function of d-spacing or diffraction angle. Anisotropic line-shape broadening, in which the peak width is not a smooth function of d spacing, is sometimes observed in powder patterns and has been difficult to model with whole pattern fitting or Rietveld techniques. Recently this technical problem has been overcome by incorporating the anisotropic broadening model of Stephens into the GSAS Rietveld refinement package. Such an approach has been applied to the understanding of the anisotropic line broadening now identified in various delta stabilized Pu-Ga alloys. © 2000 American Institute of Physics.


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