Polarization effects of imperfections in conducting and dielectric samples imaged with polarization-sensitive scanning near-field optical microscopy

Eggers, G.; Rosenberger, A.; Held, N.; Gu¨ntherodt, G.; Fumagalli, P.
December 2001
Applied Physics Letters;12/10/2001, Vol. 79 Issue 24, p3929
Academic Journal
The influence of intrinsic birefringence and of surface imperfections on the polarization of near-field light is investigated in thin films by polarization-sensitive scanning near-field optical microscopy in transmission mode. The experimental results will be discussed and a simple simulation algorithm is proposed.


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