Individually injected current pulses with conducting-tip, tapping-mode atomic force microscopy

Fein, Asa; Zhao, Yanming; Peterson, Charles A.; Jabbour, Ghassan E.; Sarid, Dror
December 2001
Applied Physics Letters;12/10/2001, Vol. 79 Issue 24, p3935
Academic Journal
Individually injected current pulses during the operation of a conducting-tip tapping-mode atomic force microscope have been measured under a range of experimental conditions. The bias pulses, applied during the tip-sample contact time, did not perturb the tapping operations, and eliminated artifacts associated with displacement currents. The reproducible injection of current density pulses on the order of 10 µA/nm[sup 2] per tap can be applied to spreading resistance measurements and to storage applications employing, for example, phase change by Joule heating and magnetic switching by spin-polarized current.


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