Inter- and intragrain transport measurements in YBa[sub 2]Cu[sub 3]O[sub 7-x] deformation textured coated conductors

Feldmann, D. M.; Larbalestier, D. C.; Verebelyi, D. T.; Zhang, W.; Li, Q.; Riley, G. N.; Feenstra, R.; Goyal, A.; Lee, D. F.; Paranthaman, M.; Kroeger, D. M.; Christen, D. K.
December 2001
Applied Physics Letters;12/10/2001, Vol. 79 Issue 24, p3998
Academic Journal
Using photolithography, links for transport measurement have been placed across individual Ni grain boundaries and within individual Ni grains on several coated conductor samples. The typical Ni grain size is ∼50 µm, while the YBa[sub 2]Cu[sub 3]O[sub 7-x] grains are submicron in size. It is found that the intragrain J[sub c](0 T, 77 K) can exceed 5 MA/cm², thus showing that present coated conductor J[sub c] values are not significantly limited by the intragrain J[sub c]. Inter- and intragrain J[sub c] values ranged from one-half to more than four times full-width measured values, demonstrating that current percolates through the conductor. The misorientation angle dependence of J[sub c] fits well with previous studies of [001] tilt SrTiO[sub 3] bicrystals.


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