Optical constants of wurtzite ZnS thin films determined by spectroscopic ellipsometry

Ong, H. C.; Chang, R. P. H.
November 2001
Applied Physics Letters;11/26/2001, Vol. 79 Issue 22, p3612
Academic Journal
The complex dielectric functions of wurtzite ZnS thin films grown on (0001) Al[sub 2]O[sub 3] have been determined by using spectroscopic ellipsometry over the spectral range of 1.33–4.7 eV. Below the band gap, the refractive index n is found to follow the first-order Sellmeir dispersion relationship n[sup 2](λ)=1+2.22λ[sup 2]/(λ[sup 2]-0.038[sup 2]). Strong and well-defined free excitonic features located above the band edge are clearly observed at room temperature. The intrinsic optical parameters of wurtzite ZnS such as band gaps and excitonic binding energies have been determined by fitting the absorption spectrum using a modified Elliott expression together with Lorentizan broadening. Both parameters are found to be larger than their zinc blende counterparts. © 2001 American Institute of Physics.


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