Response to 'Comment on 'MEMS-based high speed scanning probe microscopy'' [Rev. Sci. Instrum. 81, 117101 (2010)]

Disseldorp, E. C. M.; Tabak, F. C.; Katan, A. J.; Hesselberth, M. B. S.; Oosterkamp, T. H.; Frenken, J. W. M.; van Spengen, W. M.
November 2010
Review of Scientific Instruments;Nov2010, Vol. 81 Issue 11, p117102
Academic Journal
No abstract available.


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