Size-induced lattice relaxation in CeO[sub 2] nanoparticles

Zhou, X.-D.; Huebner, W.
November 2001
Applied Physics Letters;11/19/2001, Vol. 79 Issue 21, p3512
Academic Journal
Size-induced lattice relaxation was observed for nanoscale CeO[sub 2] single crystals with an average size from 4 to 60 nm. Results showed the finest crystallites exhibited no strain-induced line broadening, while high temperature annealing resulted in larger grain sizes and significant strains. The observed shift in the x-ray diffraction lattice parameters was assumed to be due to the formation of defects on the lattice, specifically oxygen vacancies. Modeling revealed that the oxygen vacancy concentration ([V[sub O][sup ••]]) was found to be approx. 4×10[sup 20]/cm[sup 3] for the 4 nm crystallites, and decreased two orders of magnitude for larger 60 nm single crystals. © 2001 American Institute of Physics.


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