Multifrequency channel microwave reflectometer with frequency hopping operation for density fluctuation measurements in Large Helical Device

Tokuzawa, T.; Ejiri, A.; Kawahata, K.
October 2010
Review of Scientific Instruments;Oct2010, Vol. 81 Issue 10, p10D906
Academic Journal
In order to measure the internal structure of density fluctuations using a microwave reflectometer, the broadband frequency tunable system, which has the ability of fast and stable hopping operation, has been improved in the Large Helical Device. Simultaneous multipoint measurement is the key issue of this development. For accurate phase measurement, the system utilizes a single sideband modulation technique. Currently, a dual channel heterodyne frequency hopping reflectometer system has been constructed and applied to the Alfvén eigenmode measurements.


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